
Using two light sources of different wavelengths is of critical importance because
the measurement accuracy of small particles is wavelength dependent. Figure A (below) shows the 360° light scattering patterns from 50nm and 70nm particles as generated from a 650 nm red laser. The patterns are practically identical across all angles and the algorithm will not be able to accurately calculate the different particle sizes. Figure B (below) shows the same experiment using a 405nm blue LED. Distinct differences are now seen on wide angle detectors which allows for accurate calculation of these materials. Integrating a second, shorter wavelength light source is the primary means of improving nano-scale performance beyond the bare minimum laser diffraction analyzer.

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